Invention Grant
- Patent Title: Particulate matter detection device
- Patent Title (中): 颗粒物检测装置
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Application No.: US13216625Application Date: 2011-08-24
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Publication No.: US08820139B2Publication Date: 2014-09-02
- Inventor: Masahiro Tokuda , Takashi Egami , Takeshi Sakuma , Atsuo Kondo , Masanobu Miki , Keizo Iwama , Tatsuya Okayama
- Applicant: Masahiro Tokuda , Takashi Egami , Takeshi Sakuma , Atsuo Kondo , Masanobu Miki , Keizo Iwama , Tatsuya Okayama
- Applicant Address: JP Nagoya JP Minato-Ku
- Assignee: NGK Insulators, Ltd.,Honda Motor Co., Ltd.
- Current Assignee: NGK Insulators, Ltd.,Honda Motor Co., Ltd.
- Current Assignee Address: JP Nagoya JP Minato-Ku
- Agency: Burr & Brown, PLLC
- Priority: JP2010-189924 20100826
- Main IPC: G01N7/00
- IPC: G01N7/00

Abstract:
A particulate matter detection device of the present invention includes a plate-like element base material, and a pair of measurement electrodes arranged in the element base material, each of the measurement electrodes is a combteeth-like electrode including a plurality of planarly arranged combteeth portions, and a comb spine portion which connects the plurality of combteeth portions of each of the measurement electrodes to one another at one end of each of the plurality of combteeth portions, the combteeth portions of the measurement electrodes are arranged to engage with each other with a space being left therebetween, and the comb spine portion of at least one of the measurement electrodes is covered with a comb spine covering portion made of a dielectric material.
Public/Granted literature
- US20120047991A1 PARTICULATE MATTER DETECTION DEVICE Public/Granted day:2012-03-01
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