Invention Grant
- Patent Title: Nondestructive inspection apparatus and nondestructive inspection method using guided wave
- Patent Title (中): 无损检测仪器和无损检测方法使用导波
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Application No.: US13218920Application Date: 2011-08-26
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Publication No.: US08820163B2Publication Date: 2014-09-02
- Inventor: Masahiro Miki , Yoshiaki Nagashima , Masao Endou , Kojiro Kodaira , Mitsuru Odakura
- Applicant: Masahiro Miki , Yoshiaki Nagashima , Masao Endou , Kojiro Kodaira , Mitsuru Odakura
- Applicant Address: JP Ibaraki
- Assignee: Hitachi-GE Nuclear Energy, Ltd.
- Current Assignee: Hitachi-GE Nuclear Energy, Ltd.
- Current Assignee Address: JP Ibaraki
- Agency: Mattingly & Malur, PC
- Priority: JP2007-198283 20070731
- Main IPC: G01N29/04
- IPC: G01N29/04
Abstract:
A nondestructive inspection apparatus includes a pair of guided wave sensors disposed on an outer surface of a piping and a guided wave inspection device connected to the pair of guided wave sensors which, outputs a transmitting signal for propagating a guided wave to the guided wave sensors, and obtains a receiving signal by receiving a propagated signal by the guided wave sensors. An inspection-result storage device stores the guided wave as a digitized signal of the received wave and an inspection-result diagnostic device performs arithmetic processing of judging whether or not a signal associated with a defect exists.
Public/Granted literature
- US20110308316A1 NONDESTRUCTIVE INSPECTION APPARATUS AND NONDESTRUCTIVE INSPECTION METHOD USING GUIDED WAVE Public/Granted day:2011-12-22
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