Invention Grant
US08820335B2 Cleaning apparatus, substrate processing system, cleaning method, program and storage medium
有权
清洁装置,基板处理系统,清洁方法,程序和存储介质
- Patent Title: Cleaning apparatus, substrate processing system, cleaning method, program and storage medium
- Patent Title (中): 清洁装置,基板处理系统,清洁方法,程序和存储介质
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Application No.: US12778209Application Date: 2010-05-12
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Publication No.: US08820335B2Publication Date: 2014-09-02
- Inventor: Michitaka Amiya , Kazuyoshi Eshima
- Applicant: Michitaka Amiya , Kazuyoshi Eshima
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: Abelman, Frayne & Schwab
- Priority: JP2009-115490 20090512
- Main IPC: B08B3/02
- IPC: B08B3/02 ; H01L21/67 ; H01L21/673

Abstract:
Disclosed is a cleaning apparatus capable of cleaning a holding unit of a holding member that holds a substrate. The cleaning apparatus is configured to prevent a cleaning liquid from adhering to a rear-end unit of the holding member where a drying is difficult to be done, while a cleaning process is performed by spraying the cleaning liquid to the holding unit. Also disclosed are a substrate processing system that incorporates the cleaning apparatus, a cleaning method based on the cleaning apparatus, a program to perform the cleaning method, and a storage medium to store the program. The cleaning apparatus is equipped with a cleaning unit that cleans the holding unit by spraying the cleaning liquid to the holding unit, and a cover unit that covers the rear-end unit by making a back-and-forth operation with respect to the holding member.
Public/Granted literature
- US20100288313A1 CLEANING APPARATUS, SUBSTRATE PROCESSING SYSTEM, CLEANING METHOD, PROGRAM AND STORAGE MEDIUM Public/Granted day:2010-11-18
Information query
IPC分类: