Invention Grant
- Patent Title: Profile engineered thin film devices and structures
- Patent Title (中): 型材设计薄膜器件和结构
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Application No.: US13791721Application Date: 2013-03-08
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Publication No.: US08822301B2Publication Date: 2014-09-02
- Inventor: Arvind Kamath , Erik Scher , Patrick Smith , Aditi Chandra , Steven Molesa
- Applicant: Arvind Kamath , Erik Scher , Patrick Smith , Aditi Chandra , Steven Molesa
- Applicant Address: NO Oslo
- Assignee: Thin Film Electronics ASA
- Current Assignee: Thin Film Electronics ASA
- Current Assignee Address: NO Oslo
- Agency: Murabito Hao & Barnes LLP
- Agent Andrew D. Fortney
- Main IPC: H01L21/20
- IPC: H01L21/20

Abstract:
The present invention relates to electrically active devices (e.g., capacitors, transistors, diodes, floating gate memory cells, etc.) having dielectric, conductor, and/or semiconductor layers with smooth and/or dome-shaped profiles and methods of forming such devices by depositing or printing (e.g., inkjet printing) an ink composition that includes a semiconductor, metal, or dielectric precursor. The smooth and/or dome-shaped cross-sectional profile allows for smooth topological transitions without sharp steps, preventing feature discontinuities during deposition and allowing for more complete step coverage of subsequently deposited structures. The inventive profile allows for both the uniform growth of oxide layers by thermal oxidation, and substantially uniform etching rates of the structures. Such oxide layers may have a uniform thickness and provide substantially complete coverage of the underlying electrically active feature. Uniform etching allows for an efficient method of reducing a critical dimension of an electrically active structure by simple isotropic etch.
Public/Granted literature
- US20130189823A1 Profile Engineered Thin Film Devices and Structures Public/Granted day:2013-07-25
Information query
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