Invention Grant
- Patent Title: Method for providing oxide layers
- Patent Title (中): 提供氧化物层的方法
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Application No.: US12906766Application Date: 2010-10-18
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Publication No.: US08822330B2Publication Date: 2014-09-02
- Inventor: Philippe Soussan , Eric Beyne , Philippe Muller
- Applicant: Philippe Soussan , Eric Beyne , Philippe Muller
- Applicant Address: BE Leuven
- Assignee: IMEC
- Current Assignee: IMEC
- Current Assignee Address: BE Leuven
- Agency: Knobbe, Martens Olson & Bear LLP
- Main IPC: H01L21/4763
- IPC: H01L21/4763 ; H01L21/02 ; H01L21/316

Abstract:
A method for providing an oxide layer on a semiconductor substrate is disclosed. In one aspect, the method includes obtaining a semiconductor substrate. The substrate may have a three-dimensional structure, which may comprise at least one hole. The method may also include forming an oxide layer on the substrate, for example, on the three-dimensional structure, by anodizing the substrate in an acidic electrolyte solution.
Public/Granted literature
- US20110086507A1 METHOD FOR PROVIDING OXIDE LAYERS Public/Granted day:2011-04-14
Information query
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