Invention Grant
US08822894B2 Light-field pixel for detecting a wavefront based on a first intensity normalized by a second intensity
有权
用于基于由第二强度归一化的第一强度来检测波前的光场像素
- Patent Title: Light-field pixel for detecting a wavefront based on a first intensity normalized by a second intensity
- Patent Title (中): 用于基于由第二强度归一化的第一强度来检测波前的光场像素
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Application No.: US13344523Application Date: 2012-01-05
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Publication No.: US08822894B2Publication Date: 2014-09-02
- Inventor: Guoan Zheng , Changhuei Yang
- Applicant: Guoan Zheng , Changhuei Yang
- Applicant Address: US CA Pasadena
- Assignee: California Institute of Technology
- Current Assignee: California Institute of Technology
- Current Assignee Address: US CA Pasadena
- Agency: Weaver Austin Villeneuve & Sampson LLP
- Agent Sheila Martinez-Lemke
- Main IPC: G01J1/20
- IPC: G01J1/20 ; G01J9/00
Abstract:
A light-field pixel for detecting a wavefront, the light-field pixel comprises an aperture layer, a light detector layer, and a processor. The aperture layer has a non-conventional aperture and a non-conventional aperture. The non-conventional aperture has a higher gradient of transmission at normal incidence than the conventional aperture. The light detector is configured to measure a first intensity of light through the non-conventional aperture and a second intensity of light through the conventional aperture. The processor is configured to detect the wavefront based on the first intensity normalized by the second intensity.
Public/Granted literature
- US20120211644A1 LIGHT-FIELD PIXEL Public/Granted day:2012-08-23
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