Invention Grant
US08822936B2 Detector for detecting particle radiation of an energy in the range of 150 eV to 300 keV, and a materials mapping apparatus with such a detector
有权
用于检测在150eV至300keV范围内的能量的粒子辐射的检测器,以及具有这种检测器的材料映射装置
- Patent Title: Detector for detecting particle radiation of an energy in the range of 150 eV to 300 keV, and a materials mapping apparatus with such a detector
- Patent Title (中): 用于检测在150eV至300keV范围内的能量的粒子辐射的检测器,以及具有这种检测器的材料映射装置
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Application No.: US12681333Application Date: 2007-10-04
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Publication No.: US08822936B2Publication Date: 2014-09-02
- Inventor: Ulrik Lund Olsen , Henning Friis Poulsen , Soren Schmidt
- Applicant: Ulrik Lund Olsen , Henning Friis Poulsen , Soren Schmidt
- Applicant Address: DK Lyngby
- Assignee: Danmarks Tekniske Universitet
- Current Assignee: Danmarks Tekniske Universitet
- Current Assignee Address: DK Lyngby
- Agency: Sughrue Mion, PLLC
- International Application: PCT/DK2007/050140 WO 20071004
- International Announcement: WO2009/043347 WO 20090409
- Main IPC: G01T1/24
- IPC: G01T1/24 ; G01J5/02

Abstract:
Detector for detection of particle radiation, particularly particle radiation having an energy in the range of 150 eV to 300 keV, comprising at least one detector element, said detector element comprising a semiconductor detector material, at least a set of line-shaped electrodes conductively connected to at least one surface of said semiconductor detector material, each set comprising a plurality of line-shaped electrodes extending in parallel, and signal processor communicating with said line-shaped electrodes, wherein, in each set, said line-shaped electrodes are distributed with a strip pitch of less than 3 μm, and that the thickness of said semiconductor detector material is of less than two times the strip pitch of said line-shaped electrodes.
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