Invention Grant
- Patent Title: Surface contamination monitor
- Patent Title (中): 表面污染监测仪
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Application No.: US13144053Application Date: 2010-07-09
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Publication No.: US08822944B2Publication Date: 2014-09-02
- Inventor: Akihito Hora , Takeshi Ishikura , Satoshi Takano , Daisuke Inui
- Applicant: Akihito Hora , Takeshi Ishikura , Satoshi Takano , Daisuke Inui
- Applicant Address: JP
- Assignee: Fuji Electric Co., Ltd
- Current Assignee: Fuji Electric Co., Ltd
- Current Assignee Address: JP
- Agency: Rossi, Kimms & McDowell LLP
- Priority: JP2009-164092 20090710
- International Application: PCT/JP2010/061664 WO 20100709
- International Announcement: WO2011/004883 WO 20110113
- Main IPC: G01J1/42
- IPC: G01J1/42 ; G01T1/167

Abstract:
Provided is a surface contamination monitor that includes a hand and foot contamination monitor that can be relocated to an inspection site in a simple manner. A surface contamination monitor has a folding mechanism that allows folding a monitor main body, and comprises a base whose top face is provided with radiation detection elements for measurement of a foot portion, a support column provided at a center of a far side of the top face of the base, and an upper unit, which is fixed to a top end portion of the support column, and on which there are provided radiation detection elements for measurement of a hand portion. The folding mechanism allows the support column to bend towards the top face of the base by way of a first hinge and to bend towards an opposite side by way of a second hinge.
Public/Granted literature
- US20120161265A1 SURFACE CONTAMINATION MONITOR Public/Granted day:2012-06-28
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