Invention Grant
US08823086B2 Semiconductor device and method of manufacturing the same 有权
半导体装置及其制造方法

  • Patent Title: Semiconductor device and method of manufacturing the same
  • Patent Title (中): 半导体装置及其制造方法
  • Application No.: US13346829
    Application Date: 2012-01-10
  • Publication No.: US08823086B2
    Publication Date: 2014-09-02
  • Inventor: Chul Hwan Cho
  • Applicant: Chul Hwan Cho
  • Applicant Address: KR Icheon
  • Assignee: Hynix Semiconductor Inc.
  • Current Assignee: Hynix Semiconductor Inc.
  • Current Assignee Address: KR Icheon
  • Priority: KR10-2011-0044205 20110511
  • Main IPC: H01L29/66
  • IPC: H01L29/66
Semiconductor device and method of manufacturing the same
Abstract:
A semiconductor device having a buried gate is provided. The semiconductor device is formed in a structure in which a plurality of contacts having small step differences are stacked without forming a metal contact applying an operation voltage to the buried gate in a single contact and a contact pad is formed between the contacts so that failure due to misalignment can be prevented without a separate additional process for forming the contacts.
Public/Granted literature
Information query
Patent Agency Ranking
0/0