Invention Grant
- Patent Title: Semiconductor manufacturing method and semiconductor structure thereof
- Patent Title (中): 半导体制造方法及其半导体结构
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Application No.: US13644749Application Date: 2012-10-04
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Publication No.: US08823169B2Publication Date: 2014-09-02
- Inventor: Chih-Ming Kuo , Lung-Hua Ho , Shih-Chieh Chang , Chia-Yeh Huang , Chin-Tang Hsieh
- Applicant: Chipbond Technology Corporation
- Applicant Address: TW Hsinchu
- Assignee: Chipbond Technology Corporation
- Current Assignee: Chipbond Technology Corporation
- Current Assignee Address: TW Hsinchu
- Agency: Jackson IPG PLLC
- Priority: TW101125709A 20120718
- Main IPC: H01L23/48
- IPC: H01L23/48 ; H01L23/52

Abstract:
A semiconductor manufacturing method includes providing a carrier; forming a first photoresist layer; forming plural core portions; removing the first photoresist layer; forming a second photoresist layer; forming a plurality of connection portions, each of the plurality of connection portions includes a first connection layer and a second connection layer and connects to each of the core portions to form a hybrid bump, wherein each of the first connection layers comprises a base portion, a projecting portion and an accommodating space, each base portion comprises an upper surface, each projecting portion is protruded to the upper surface and located on top of each core portion, each accommodating space is located outside each projecting portion, the second connection layers cover the projecting portions and the upper surfaces, and the accommodating spaces are filled by the second connection layers; removing the second photoresist layer to reveal the hybrid bumps.
Public/Granted literature
- US20140021601A1 SEMICONDUCTOR MANUFACTURING METHOD AND SEMICONDUCTOR STRUCTURE THEREOF Public/Granted day:2014-01-23
Information query
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