Invention Grant
- Patent Title: System and method for electrostatic discharge testing of devices under test
- Patent Title (中): 被测设备静电放电试验的系统和方法
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Application No.: US13462782Application Date: 2012-05-02
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Publication No.: US08823383B2Publication Date: 2014-09-02
- Inventor: Kyung Jin Min , David J. Pommerenke , Giorgi Muchaidze , Besarion Chikhradze , Iuri Kalandarishvili
- Applicant: Kyung Jin Min , David J. Pommerenke , Giorgi Muchaidze , Besarion Chikhradze , Iuri Kalandarishvili
- Main IPC: G01R29/12
- IPC: G01R29/12

Abstract:
A system and method for electrostatic discharge (ESD) testing devices under test (DUTs) uses an ESD gun attached to a robotic arm to execute ESD tests. The system and method also uses cameras positioned around a DUT placed on a testing table to define at least one test point on a surface of the DUT. Using the defined test point, as well as settings on the ESD gun and a testing process scenario that includes actions to be executed by the system, the testing process is performed by the system.
Public/Granted literature
- US20130002273A1 SYSTEM AND METHOD FOR ELECTROSTATIC DISCHARGE TESTING OF DEVICES UNDER TEST Public/Granted day:2013-01-03
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