Invention Grant
- Patent Title: Fine particle detection system
- Patent Title (中): 细颗粒检测系统
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Application No.: US13444057Application Date: 2012-04-11
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Publication No.: US08823384B2Publication Date: 2014-09-02
- Inventor: Toshiya Matsuoka , Masayuki Motomura , Takeshi Sugiyama , Keisuke Tashima , Hitoshi Yokoi
- Applicant: Toshiya Matsuoka , Masayuki Motomura , Takeshi Sugiyama , Keisuke Tashima , Hitoshi Yokoi
- Applicant Address: JP Aichi
- Assignee: NGK Spark Plug Co., Ltd.
- Current Assignee: NGK Spark Plug Co., Ltd.
- Current Assignee Address: JP Aichi
- Agency: Sughrue Mion, PLLC
- Priority: JP2011-088549 20110412
- Main IPC: G01N27/70
- IPC: G01N27/70 ; G01N15/06

Abstract:
There is provided a fine particle detection system with a fine particle sensor, a cable and a sensor drive control device. The fine particle sensor has an ion source unit with first and second electrodes, a particle charging unit and inner and outer sensor casings. The cable has a power supply wiring line connected to the second electrode, an inner shield line electrically continuous with the inner sensor casing and an outer shield line electrically continuous with the outer sensor casing. The sensor drive control device has an ion-source power supply circuit, a signal current detection circuit, an inner circuit casing electrically continuous with a first output terminal of the ion-source power supply circuit and surrounding the ion-source power supply circuit and an outer circuit casing connected to the ground potential and shielding the ion-source power supply circuit, the signal current detection circuit and the inner circuit casing.
Public/Granted literature
- US20120262182A1 FINE PARTICLE DETECTION SYSTEM Public/Granted day:2012-10-18
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