Invention Grant
- Patent Title: Load circuit for testing USB ports
- Patent Title (中): 用于测试USB端口的负载电路
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Application No.: US13552574Application Date: 2012-07-18
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Publication No.: US08823403B2Publication Date: 2014-09-02
- Inventor: Zhen-Sen Li , Jian-She Shen
- Applicant: Zhen-Sen Li , Jian-She Shen
- Applicant Address: CN Shenzhen TW New Taipei
- Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: CN Shenzhen TW New Taipei
- Agency: Novak Druce Connolly Bove + Quigg LLP
- Priority: CN201210045051 20120227
- Main IPC: G01R31/04
- IPC: G01R31/04 ; G06F3/00 ; G06F13/20 ; G01R1/28 ; G06F11/22 ; G01R31/30

Abstract:
An exemplary load circuit includes a switch unit and a current dividing circuit. The switch unit includes a number of switches. The current dividing circuit includes a number of sub-circuits. A terminal of a resistance module of each of the sub-circuits is connected to both a power terminal and a terminal of a corresponding one of the switches. The other terminal of the resistance module of each of the sub-circuits is connected to a drain of a transistor of each of the sub-circuits. A source of the transistor is connected to ground. A gate of the transistor is connected to ground, and is also connected to another terminal of the corresponding switch.
Public/Granted literature
- US20130222000A1 LOAD CIRCUIT FOR TESTING USB PORTS Public/Granted day:2013-08-29
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