Invention Grant
US08823404B2 Evaluation device and evaluation method for substrate mounting apparatus and evaluation substrate used for the same 有权
用于其的基板安装装置和评价基板的评价装置及评价方法

Evaluation device and evaluation method for substrate mounting apparatus and evaluation substrate used for the same
Abstract:
There are provided an evaluation device and an evaluation method for a substrate mounting apparatus capable of simply evaluating a temperature control function of the substrate mounting apparatus depending on evaluation conditions or circumstances and an evaluation substrate used for the same. The substrate mounting apparatus holds a target substrate mounted on a mounting surface and controls a temperature of the target substrate. The evaluation device includes an evacuable airtight chamber in which the substrate mounting apparatus is provided; an evaluation substrate which is mounted on the mounting surface instead of the target substrate and includes a self-heating resistance heater; and a temperature measurement unit which measures a temperature of the evaluation substrate.
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