Invention Grant
US08823429B1 Data transition density normalization for half rate CDRs with bang-bang phase detectors
有权
具有爆轰相位检测器的半速率CDR的数据转换密度归一化
- Patent Title: Data transition density normalization for half rate CDRs with bang-bang phase detectors
- Patent Title (中): 具有爆轰相位检测器的半速率CDR的数据转换密度归一化
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Application No.: US14084504Application Date: 2013-11-19
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Publication No.: US08823429B1Publication Date: 2014-09-02
- Inventor: Archit Joshi
- Applicant: STMicroelectronics International N.V.
- Applicant Address: NL Amsterdam
- Assignee: STMicroelectronics International N.V.
- Current Assignee: STMicroelectronics International N.V.
- Current Assignee Address: NL Amsterdam
- Agency: Seed IP Law Group PLLC
- Main IPC: H03L7/06
- IPC: H03L7/06

Abstract:
A clock and data recovery circuit includes a phase detector circuit, a charge pump circuit, and a voltage controlled oscillator. The phase detector circuit receives a data signal from an external device and a clock signal from the voltage controlled oscillator and generates a first and a second phase difference signal. The charge pump circuit includes an OR gate receiving on its inputs the first and the second phase difference signals and configured to generate a current if the first and/or second phase difference signal is high.
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