Invention Grant
- Patent Title: Electronic device and method for optimizing order of testing points of circuit boards
- Patent Title (中): 用于优化电路板测试点顺序的电子设备和方法
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Application No.: US13221858Application Date: 2011-08-30
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Publication No.: US08823538B2Publication Date: 2014-09-02
- Inventor: Hsien-Chuan Liang , Shen-Chun Li , Shou-Kuo Hsu
- Applicant: Hsien-Chuan Liang , Shen-Chun Li , Shou-Kuo Hsu
- Applicant Address: TW New Taipei
- Assignee: Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: TW New Taipei
- Agency: Novak Druce Connolly Bove + Quigg LLP
- Priority: TW100101572A 20110117
- Main IPC: G08B21/00
- IPC: G08B21/00 ; G01R31/28

Abstract:
In a method for optimizing an order in which certain points on a circuit board can be tested and evaluated, a coordinate system is established in a circuit diagram of a circuit board, and at least one locating point is preset. When an operator selects a signal path routing within the circuit diagram, the method can display the testing points in the selected signal path routing on a display device. After calculating the distance between each of the testing points and each of the at least one locating point, a group of distances is obtained. By comparing the distances, the minimum distance can be determined from the group of distances. The method further optimizes the order of the testing points according to the distance between each of the testing points and the locating point that consists of the minimum distance.
Public/Granted literature
- US20120182154A1 ELECTRONIC DEVICE AND METHOD FOR OPTIMIZING ORDER OF TESTING POINTS OF CIRCUIT BOARDS Public/Granted day:2012-07-19
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