Invention Grant
- Patent Title: Antenna characteristic measuring system and antenna characteristic measuring method
- Patent Title (中): 天线特征测量系统和天线特征测量方法
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Application No.: US13191576Application Date: 2011-07-27
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Publication No.: US08823593B2Publication Date: 2014-09-02
- Inventor: Kuniyuki Miyata
- Applicant: Kuniyuki Miyata
- Applicant Address: JP Kawasaki
- Assignee: Fujitsu Limited
- Current Assignee: Fujitsu Limited
- Current Assignee Address: JP Kawasaki
- Agency: Staas & Halsey LLP
- Priority: JP2010-181623 20100816
- Main IPC: G01R29/10
- IPC: G01R29/10

Abstract:
There is provided an antenna characteristic measuring system which includes a measuring point scanner to scan a measuring point, an antenna gain measuring device which measures an antenna gain of a measured antenna at a plurality of the measuring points, determines a reference point among the plurality of the measuring points, and obtains antenna gain difference values between the antenna gain at the reference point and each of the antenna gain at the plurality of the measuring points other than the reference point, and an antenna characteristic measuring device which measures a reference antenna characteristic of the measured antenna at the reference point and obtains an antenna characteristic of the measured antenna at each of the plurality of the measuring points other than the reference point by correcting the reference antenna characteristic with each of the difference values.
Public/Granted literature
- US20120038522A1 ANTENNA CHARACTERISTIC MEASURING SYSTEM AND ANTENNA CHARACTERISTIC MEASURING METHOD Public/Granted day:2012-02-16
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