Invention Grant
US08823593B2 Antenna characteristic measuring system and antenna characteristic measuring method 有权
天线特征测量系统和天线特征测量方法

  • Patent Title: Antenna characteristic measuring system and antenna characteristic measuring method
  • Patent Title (中): 天线特征测量系统和天线特征测量方法
  • Application No.: US13191576
    Application Date: 2011-07-27
  • Publication No.: US08823593B2
    Publication Date: 2014-09-02
  • Inventor: Kuniyuki Miyata
  • Applicant: Kuniyuki Miyata
  • Applicant Address: JP Kawasaki
  • Assignee: Fujitsu Limited
  • Current Assignee: Fujitsu Limited
  • Current Assignee Address: JP Kawasaki
  • Agency: Staas & Halsey LLP
  • Priority: JP2010-181623 20100816
  • Main IPC: G01R29/10
  • IPC: G01R29/10
Antenna characteristic measuring system and antenna characteristic measuring method
Abstract:
There is provided an antenna characteristic measuring system which includes a measuring point scanner to scan a measuring point, an antenna gain measuring device which measures an antenna gain of a measured antenna at a plurality of the measuring points, determines a reference point among the plurality of the measuring points, and obtains antenna gain difference values between the antenna gain at the reference point and each of the antenna gain at the plurality of the measuring points other than the reference point, and an antenna characteristic measuring device which measures a reference antenna characteristic of the measured antenna at the reference point and obtains an antenna characteristic of the measured antenna at each of the plurality of the measuring points other than the reference point by correcting the reference antenna characteristic with each of the difference values.
Information query
Patent Agency Ranking
0/0