Invention Grant
- Patent Title: Light absorbance measurement method and apparatus
- Patent Title (中): 吸光度测定方法及装置
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Application No.: US13925304Application Date: 2013-06-24
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Publication No.: US08823940B2Publication Date: 2014-09-02
- Inventor: Yeong Bae Yeo
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: Sughrue Mion, PLLC
- Priority: KR10-2010-0011083 20100205
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01N21/75

Abstract:
Methods and apparatuses for measuring a light absorbance are provided. The method measures light absorbance of at least one detection chamber of a microfluidic device, including the detection chamber and at least one reference chamber. The detection chamber may accommodate a test subject. The method includes detecting a plurality of reference transmitted light intensities for the at least one reference chamber and estimating a value between the plurality of reference transmitted light intensities through nonlinear approximation. The estimated value is then applied to light absorbance measurement of the detection chamber to reduce a light absorbance error of the detection chamber.
Public/Granted literature
- US20130280818A1 LIGHT ABSORBANCE MEASUREMENT METHOD AND APPARATUS Public/Granted day:2013-10-24
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