Invention Grant
US08824023B2 Scanning method for a large-size scanner system using a stitching process
有权
使用缝合过程的大型扫描仪系统的扫描方法
- Patent Title: Scanning method for a large-size scanner system using a stitching process
- Patent Title (中): 使用缝合过程的大型扫描仪系统的扫描方法
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Application No.: US14007051Application Date: 2012-04-19
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Publication No.: US08824023B2Publication Date: 2014-09-02
- Inventor: Simon Kaempflein , Burkhard Schoelpen
- Applicant: Simon Kaempflein , Burkhard Schoelpen
- Applicant Address: DE Niederdreisbach
- Assignee: Roth + Weber GmbH
- Current Assignee: Roth + Weber GmbH
- Current Assignee Address: DE Niederdreisbach
- Agent Andrew Wilford
- Priority: DE102011018496 20110423
- International Application: PCT/EP2012/001692 WO 20120419
- International Announcement: WO2012/146358 WO 20121101
- Main IPC: H04N1/04
- IPC: H04N1/04 ; H04N1/409 ; H04N1/193 ; H04N1/387 ; H04N1/19

Abstract:
The invention relates to a scanning method for a large-size scanner system (1) comprising at least two image detection elements (2) that are used for scanning a large-size original (4) to be scanned and are arranged in a cascaded manner so as to have at least one overlapping area (13, 14). Said method, in which the image data in the at least one overlapping area (13, 14) of the image detection elements (2) is combined using a stitching process, said at least one overlapping area (13, 14) being searched for image data within a search region (10), includes the following steps: recognizing (18) the texture within the defined search region (10) of the original (4) to be scanned; assessing the data density in the recognized texture to determine a measure (19) of the texture content; weighting (22) the data density as a function of the measure (19) of the texture content of the recognized texture; detecting (20) congruent image elements within the defined search region (10) of the original (4) to be scanned; for each measured point (16 to 17), determining (24 to 25) a weighted deviation from the weighting (22) derived from the texture and the determined deviation (24 to 25) of each measurement; determining (27, 28) a weighted average of the deviations (29 to 30) from said weighted deviations (24 to 25); and calculating, from said weighted average (27, 28) of the deviation, shift values (29, 30) for correcting the position of the offset image elements such that said image elements are made to be congruent.
Public/Granted literature
- US20140036323A1 SCANNING METHOD FOR A LARGE-SIZE SCANNER SYSTEM USING A STITCHING PROCESS Public/Granted day:2014-02-06
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