Invention Grant
US08824206B2 Non-volatile semiconductor memory device and readout method thereof
有权
非易失性半导体存储器件及其读出方法
- Patent Title: Non-volatile semiconductor memory device and readout method thereof
- Patent Title (中): 非易失性半导体存储器件及其读出方法
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Application No.: US13677796Application Date: 2012-11-15
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Publication No.: US08824206B2Publication Date: 2014-09-02
- Inventor: Masayuki Oishi , Nobuhiko Ito
- Applicant: Powerchip Technology Corporation
- Applicant Address: TW Hsin-Chu
- Assignee: Powerchip Technology Corporation
- Current Assignee: Powerchip Technology Corporation
- Current Assignee Address: TW Hsin-Chu
- Agency: Muncy, Geissler, Olds & Lowe, P.C.
- Priority: JP2012-159685 20120718
- Main IPC: G11C16/04
- IPC: G11C16/04 ; G11C16/26

Abstract:
A non-volatile semiconductor device includes: memory strings formed by series connection of memory cells respectively connected to word lines, wherein each memory string is connected between a bit line and a source line via first and second select gate transistors; and a control circuit controlling the first and second select gate transistors, such that when voltage of the word line is raised to a predetermined value for data readout from the memory cell, a first status where the first select gate transistor is turned on and the second select gate transistor is turned off and second status where the first select gate transistor is turned off and the second select gate transistor is turned on are generated alternately.
Public/Granted literature
- US20140022845A1 NON-VOLATILE SEMICONDUCTOR MEMORY DEVICE AND READOUT METHOD THEREOF Public/Granted day:2014-01-23
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