Systems, processes, and structures provide near-field transmit power measurement for MIMO wireless devices (DUT), such as for any of product development, product verification, and/or production testing. A test signal, such as comprising a pulse train signal, is provided to a MIMO device under test (DUT), wherein portions of the test signal controllably steered and sequentially transmitted from each of the device antennas, to one or more test antennas that are positioned in close proximity to the MIMO DUT. The near-field power of the received test signals is measured, to quickly and efficiently determine if one or more data streams of the MIMO DUT has a problem.