Invention Grant
- Patent Title: Detecting wasteful data collection
- Patent Title (中): 检测浪费的数据收集
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Application No.: US13158038Application Date: 2011-06-10
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Publication No.: US08825609B2Publication Date: 2014-09-02
- Inventor: Vikram Duvvoori , Satish Venkatesan Srinivasan , Prasad A Chodavarapu , Ravindra S. Gajulapalli , Rajesh Agrawal Ramesh
- Applicant: Vikram Duvvoori , Satish Venkatesan Srinivasan , Prasad A Chodavarapu , Ravindra S. Gajulapalli , Rajesh Agrawal Ramesh
- Applicant Address: US CA Sunnyvale
- Assignee: HCL America, Inc.
- Current Assignee: HCL America, Inc.
- Current Assignee Address: US CA Sunnyvale
- Agency: Schwegman Lundberg & Woessner, P.A.
- Main IPC: G06F17/30
- IPC: G06F17/30 ; G06Q10/00

Abstract:
A method and system comprises a duplication identifier module to analyze data input information to automatically identify duplicate expected inputs associated with a process. The system includes logical process model information defining a logically structured series of process activities and data input information representing a plurality of expected inputs associated with respective process activities, with each expected input being indicative of expected collection of a corresponding data element during execution of the associated process activity. Each duplicate expected input comprises one of the plurality of expected inputs for which there is at least one other expected input with respect to a common corresponding data element.
Public/Granted literature
- US20120317081A1 DETECTING WASTEFUL DATA COLLECTION Public/Granted day:2012-12-13
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