Invention Grant
- Patent Title: Proximity sensor calibration
- Patent Title (中): 接近传感器校准
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Application No.: US13218777Application Date: 2011-08-26
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Publication No.: US08826188B2Publication Date: 2014-09-02
- Inventor: Leonid Sheynblat , Chenna Bayapureddy , Kyoung Cheol Oh
- Applicant: Leonid Sheynblat , Chenna Bayapureddy , Kyoung Cheol Oh
- Applicant Address: US CA San Diego
- Assignee: Qualcomm Incorporated
- Current Assignee: Qualcomm Incorporated
- Current Assignee Address: US CA San Diego
- Agency: Kilpatrick Townsend & Stockton LLP
- Main IPC: G06F3/048
- IPC: G06F3/048 ; G06F3/033
Abstract:
The subject matter disclosed herein relates to proximity sensors to measure distance from a surface, and more particularly, calibrating proximity sensors to adjust for various reflecting surfaces.
Public/Granted literature
- US20130049641A1 PROXIMITY SENSOR CALIBRATION Public/Granted day:2013-02-28
Information query
