Invention Grant
- Patent Title: Machine calibration artifact
- Patent Title (中): 机器校准工件
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Application No.: US13325984Application Date: 2011-12-14
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Publication No.: US08826719B2Publication Date: 2014-09-09
- Inventor: Wilhelmus Weekers , John Langlais , David Harvey , Peter Hicks
- Applicant: Wilhelmus Weekers , John Langlais , David Harvey , Peter Hicks
- Applicant Address: US RI North Kingstown
- Assignee: Hexagon Metrology, Inc.
- Current Assignee: Hexagon Metrology, Inc.
- Current Assignee Address: US RI North Kingstown
- Agency: Wolf, Greenfield & Sacks, P.C.
- Main IPC: G01B1/00
- IPC: G01B1/00 ; G01B3/30 ; G01B21/04

Abstract:
A calibration artifact includes an elongated body made substantially entirely of ceramic material and having a direction of elongation. A plurality of measurement elements comprising the ceramic material are integrally formed with the elongated body, each measurement element comprising a first planar measurement surface facing in a first direction. The first planar measurement surface of each measurement element is parallel to the first planar measurement surface of each of the other measurement elements of the plurality of measurement elements. The calibration artifact may be a unitary step gauge formed with a single piece of ceramic material.
Public/Granted literature
- US20120151988A1 MACHINE CALIBRATION ARTIFACT Public/Granted day:2012-06-21
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