Invention Grant
US08828777B2 Wafer level image sensor packaging structure and manufacturing method of the same
有权
晶圆级图像传感器的封装结构及制造方法相同
- Patent Title: Wafer level image sensor packaging structure and manufacturing method of the same
- Patent Title (中): 晶圆级图像传感器的封装结构及制造方法相同
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Application No.: US13012967Application Date: 2011-01-25
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Publication No.: US08828777B2Publication Date: 2014-09-09
- Inventor: Hsiu-Wen Tu , Chung-Hsien Hsin , Han-Hsing Chen , Ming-Hui Chen , Ren-Long Kuo , Chih-Cheng Hsu , Young-Houng Shiao , Tsao-Pin Chen
- Applicant: Hsiu-Wen Tu , Chung-Hsien Hsin , Han-Hsing Chen , Ming-Hui Chen , Ren-Long Kuo , Chih-Cheng Hsu , Young-Houng Shiao , Tsao-Pin Chen
- Applicant Address: TW Hsin-Chu Hsien
- Assignee: Kingpak Technology Inc.
- Current Assignee: Kingpak Technology Inc.
- Current Assignee Address: TW Hsin-Chu Hsien
- Agency: Bacon & Thomas, PLLC
- Agent Juan Carlos A. Marquez
- Main IPC: H01L21/52
- IPC: H01L21/52 ; H01L21/56 ; H01L27/146

Abstract:
The present invention discloses a wafer level image sensor packaging structure and a manufacturing method of the same. The manufacturing method includes the following steps: providing a silicon wafer, dicing the silicon wafer, providing a plurality of transparent lids, fabricating a plurality of semi-finished products, performing a packaging process, mounting solder balls, and cutting an encapsulant between the semi-finished products. The manufacturing method of the invention has the advantage of being straightforward, uncomplicated, and cost-saving. Thus, the wafer level image sensor package structure is lightweight, thin, and compact. To prevent the image sensor chip from cracking on impact during handling, the encapsulant will be arranged on the lateral sides of the semi-finished products during the packaging process.
Public/Granted literature
- US20110241147A1 WAFER LEVEL IMAGE SENSOR PACKAGING STRUCTURE AND MANUFACTURING METHOD OF THE SAME Public/Granted day:2011-10-06
Information query
IPC分类: