Invention Grant
- Patent Title: Nanowire FET with trapezoid gate structure
- Patent Title (中): 具有梯形栅极结构的纳米线FET
-
Application No.: US13572114Application Date: 2012-08-10
-
Publication No.: US08829625B2Publication Date: 2014-09-09
- Inventor: Jeffrey W. Sleight , Sarunya Bangsaruntip , Sebastian U. Engelmann , Ying Zhang
- Applicant: Jeffrey W. Sleight , Sarunya Bangsaruntip , Sebastian U. Engelmann , Ying Zhang
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Scully, Scott, Murphy & Prsser, P.C.
- Agent H. Daniel Schnurmann
- Main IPC: H01L27/088
- IPC: H01L27/088

Abstract:
In one embodiment, a method of providing a nanowire semiconductor device is provided, in which the gate structure to the nanowire semiconductor device has a trapezoid shape. The method may include forming a trapezoid gate structure surrounding at least a portion of a circumference of a nanowire. The first portion of the trapezoid gate structure that is in direct contact with an upper surface of the nanowire has a first width and a second portion of the trapezoid gate structure that is in direct contact with a lower surface of the nanowire has a second width. The second width of the trapezoid gate structure is greater than the first width of the trapezoid gate structure. The exposed portions of the nanowire that are adjacent to the portion of the nanowire that the trapezoid gate structure is surrounding are then doped to provide source and drain regions.
Public/Granted literature
- US20120305886A1 NANOWIRE FET WITH TRAPEZOID GATE STRUCTURE Public/Granted day:2012-12-06
Information query
IPC分类: