Invention Grant
- Patent Title: Systems and methods for defect detection using exoelectrons
- Patent Title (中): 使用外电子进行缺陷检测的系统和方法
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Application No.: US13325731Application Date: 2011-12-14
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Publication No.: US08829886B2Publication Date: 2014-09-09
- Inventor: Stanton Earl Weaver , Joseph Darryl Michael
- Applicant: Stanton Earl Weaver , Joseph Darryl Michael
- Applicant Address: US NY Niskayuna
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Niskayuna
- Agent Jason K. Klindtworth
- Main IPC: G01N27/00
- IPC: G01N27/00

Abstract:
An defect detection system includes an exoemission sensor having a conductive layer and an insulating layer. The exoemission sensor is mountable to a material of interest and configured to receive exoemissions from the material while in an atmosphere. The exoemission sensor outputs a signal based upon the received emissions. An analysis device is configured to receive the signal from the exoemission sensor and determine whether a defect is present in the material based upon the signal.
Public/Granted literature
- US20130153781A1 SYSTEMS AND METHODS FOR DEFECT DETECTION USING EXOELECTRONS Public/Granted day:2013-06-20
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