Invention Grant
- Patent Title: Quantizing circuits with variable parameters
- Patent Title (中): 量化具有可变参数的电路
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Application No.: US13342844Application Date: 2012-01-03
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Publication No.: US08830105B2Publication Date: 2014-09-09
- Inventor: R. Jacob Baker
- Applicant: R. Jacob Baker
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Fletcher Yoder, P.C.
- Main IPC: H03M1/12
- IPC: H03M1/12 ; H03M1/60 ; G11C16/26 ; G11C11/56 ; H03K3/0231
Abstract:
Systems, methods, and devices for obtaining data from a data location. The method may include generating a first value by sensing a data location under a first condition and generating a second value by sensing the data location under a second condition. The method may further include combining the first value with the second value to identify data conveyed by the data location.
Public/Granted literature
- US20120098691A1 QUANTIZING CIRCUITS WITH VARIABLE PARAMETERS Public/Granted day:2012-04-26
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