Invention Grant
- Patent Title: Universal stack analyzer
- Patent Title (中): 通用堆叠分析仪
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Application No.: US13250341Application Date: 2011-09-30
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Publication No.: US08830240B1Publication Date: 2014-09-09
- Inventor: Alan D. Amis , George A. Deprez , Terry J. Hammer , Michael D. Dzado
- Applicant: Alan D. Amis , George A. Deprez , Terry J. Hammer , Michael D. Dzado
- Applicant Address: US IA Cedar Rapids
- Assignee: Rockwell Collins, Inc.
- Current Assignee: Rockwell Collins, Inc.
- Current Assignee Address: US IA Cedar Rapids
- Agent Donna P. Suchy; Daniel M. Barbieri
- Main IPC: G06T11/20
- IPC: G06T11/20 ; H04L12/26 ; G06F11/32

Abstract:
The present invention is a universal stack analyzer which is configured for collecting data at (ex.—from) all layers of a stack and filtering the collected data to isolate selected data included in the collected data. The selected data is selected via user inputs provided to a user interface of the universal stack analyzer and filtering of the collected data to isolate the selected data from the collected data is performed based upon filters generated in response to the received user inputs. The selected data is then displayed via a graphical viewer of the stack analyzer in a user-friendly graphical format. The universal stack analyzer is waveform-agnostic.
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