Invention Grant
US08830455B2 Inspection method and apparatus 有权
检验方法和装置

Inspection method and apparatus
Abstract:
In an aspect, an inspection method for detecting the presence or absence of a defect on an object, the object comprising a recess having a physical depth, is disclosed. The method includes directing radiation at the object, the radiation having a wavelength that is substantially equal to twice an optical depth of the recess, detecting radiation that is re-directed by the object or a defect on the object, and determining the presence or absence of a defect from the re-directed radiation.
Public/Granted literature
Information query
Patent Agency Ranking
0/0