Invention Grant
- Patent Title: Optical measurement apparatus and probe
- Patent Title (中): 光学测量装置和探头
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Application No.: US13870396Application Date: 2013-04-25
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Publication No.: US08830460B2Publication Date: 2014-09-09
- Inventor: Yuki Shono , Hideyuki Takaoka , Ryosuke Ito
- Applicant: Olympus Corporation
- Applicant Address: JP Tokyo
- Assignee: Olympus Corporation
- Current Assignee: Olympus Corporation
- Current Assignee Address: JP Tokyo
- Agency: Oliff PLC
- Main IPC: G01N21/00
- IPC: G01N21/00 ; A61B5/00 ; G01N21/47 ; G01B9/02

Abstract:
An optical measurement apparatus that measures a property of a scatterer, including: a light source that supplies illumination light having at least one spectral component; an illumination fiber that propagates, to a distal end thereof, light supplied from a proximal end thereof by the light source and illuminates light onto the scatterer from the distal end; first and second light detection fibers, each outputting, from a proximal end thereof, returned light from the scatterer, the returned light entering from a distal end thereof, the first and second light detection fibers having distal end positions different from each other in a longitudinal direction; a detection unit that detects light output from the proximal ends of the first and second light detection fibers; and a measurement unit that measures a property of the scatterer based on a result of the detection by the detection unit.
Public/Granted literature
- US20130235384A1 OPTICAL MEASUREMENT APPARATUS AND PROBE Public/Granted day:2013-09-12
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