Invention Grant
US08830574B2 System for read-write control of specimen analysis by automated microscope
有权
通过自动显微镜对标本分析进行读写控制的系统
- Patent Title: System for read-write control of specimen analysis by automated microscope
- Patent Title (中): 通过自动显微镜对标本分析进行读写控制的系统
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Application No.: US12566961Application Date: 2009-09-25
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Publication No.: US08830574B2Publication Date: 2014-09-09
- Inventor: Triantafyllos Tafas
- Applicant: Triantafyllos Tafas
- Applicant Address: US CT New Haven
- Assignee: Ikonisys, Inc.
- Current Assignee: Ikonisys, Inc.
- Current Assignee Address: US CT New Haven
- Agency: Kelley Drye & Warren LLP
- Main IPC: G02B21/34
- IPC: G02B21/34 ; G02B21/36 ; B01L9/00 ; G01N35/00 ; G01N1/31 ; G01N1/28
Abstract:
A system for automated microscopic analysis of a plurality of data-encoded microscope slides that provides that data written to or read from the slides may include images, analysis protocols, analytic results and other pertinent data. The system may also encompass a magazine that contains a plurality of data encoded slides.
Public/Granted literature
- US20100046068A1 AUTOMATED MICROSCOPE SLIDE READ SYSTEM Public/Granted day:2010-02-25
Information query
IPC分类:
| G | 物理 |
| G02 | 光学 |
| G02B | 光学元件、系统或仪器 |
| G02B21/00 | 显微镜 |
| G02B21/34 | .显微镜载物片，例如，在载物片上安装试样 |
