Invention Grant
US08830719B2 One-time programmable cell circuit, semiconductor integrated circuit including the same, and data judging method thereof
有权
一次性可编程单元电路，包括其的半导体集成电路及其数据判断方法
- Patent Title: One-time programmable cell circuit, semiconductor integrated circuit including the same, and data judging method thereof
- Patent Title (中): 一次性可编程单元电路，包括其的半导体集成电路及其数据判断方法
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Application No.: US13780683Application Date: 2013-02-28
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Publication No.: US08830719B2Publication Date: 2014-09-09
- Inventor: Hiroyuki Furukawa , Isao Naritake
- Applicant: Renesas Electronics Corporation
- Applicant Address: JP Kanagawa
- Assignee: Renesas Electronics Corporation
- Current Assignee: Renesas Electronics Corporation
- Current Assignee Address: JP Kanagawa
- Agency: Sughrue Mion, PLLC
- Priority: JP2009-231535 20091005
- Main IPC: G11C17/12
- IPC: G11C17/12 ; G11C17/16 ; G11C17/18
Abstract:
Provided is a semiconductor integrated circuit including: an anti-fuse element that electrically connects a first node and a first power supply terminal when data is written and electrically disconnect the first node and the first power supply terminal when data is not written; a first switch circuit that is connected between the first node and a first data line applied with a predetermine first voltage, and enters an off state from an on state according to a first control signal; and a detection part that detects write data of the anti-fuse element according to whether a voltage of the first node is substantially the same as the first voltage or substantially the same as a supply voltage of the first power supply terminal when the first switch circuit enters the off state.
Public/Granted literature
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