Invention Grant
US08831176B2 High energy X-ray inspection system using a fan-shaped beam and collimated backscatter detectors 有权
高能X射线检测系统采用扇形光束和准直反向散射检测器

  • Patent Title: High energy X-ray inspection system using a fan-shaped beam and collimated backscatter detectors
  • Patent Title (中): 高能X射线检测系统采用扇形光束和准直反向散射检测器
  • Application No.: US12993831
    Application Date: 2009-05-20
  • Publication No.: US08831176B2
    Publication Date: 2014-09-09
  • Inventor: Edward James Morton
  • Applicant: Edward James Morton
  • Applicant Address: US CA Torrance
  • Assignee: Rapiscan Systems, Inc.
  • Current Assignee: Rapiscan Systems, Inc.
  • Current Assignee Address: US CA Torrance
  • Agency: Novel IP
  • Priority: GB0809107.6 20080520
  • International Application: PCT/GB2009/001275 WO 20090520
  • International Announcement: WO2009/141613 WO 20091126
  • Main IPC: G01N23/203
  • IPC: G01N23/203 G01V5/00
High energy X-ray inspection system using a fan-shaped beam and collimated backscatter detectors
Abstract:
This invention provides a scanning system for scanning an object in a scanning zone. The scanning system includes both a radiation source arranged to irradiate the object with radiation having a peak energy of at least 900 keV and a scatter detector arranged to detect radiation scattered from the object wherein the radiation source is arranged to irradiate the object over a plurality of regions to be scanned within a single irradiation event. The scatter detector includes a plurality of detection elements, each detection element being arranged to detect scattered radiation from a predefined part of the scanning zone and a signal processor arranged to calculate scatter intensity across the plurality of detector elements.
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