Invention Grant
- Patent Title: Brain repair using electrical stimulation of healthy nodes
- Patent Title (中): 使用电刺激健康节点进行脑修复
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Application No.: US13943227Application Date: 2013-07-16
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Publication No.: US08831733B2Publication Date: 2014-09-09
- Inventor: Melanie Wilke , Igor Kagan , Richard A. Andersen
- Applicant: California Institute of Technology
- Applicant Address: US CA Pasadena
- Assignee: California Institute of Technology
- Current Assignee: California Institute of Technology
- Current Assignee Address: US CA Pasadena
- Agency: Nixon Peabody LLP
- Agent Wayne L. Tang
- Main IPC: A61N1/00
- IPC: A61N1/00 ; A61N1/36

Abstract:
A method and system of compensating for a damaged brain node is disclosed. The damaged node is determined by techniques such as fMRI or neural recording. A healthy node that can compensate for the function of the damaged node is determined. A stimulating electrode is placed on at least one functioning node to bypass the activity from the damaged node to compensate for a missing node. The functioning node is then stimulated to compensate for the damaged node.
Public/Granted literature
- US20140018882A1 BRAIN REPAIR USING ELECTRICAL STIMULATION OF HEALTHY NODES Public/Granted day:2014-01-16
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