Invention Grant
US08831901B2 Methods systems and apparatus for ranking tests used to identify faults in a system
有权
方法用于对系统中的故障进行排序测试的系统和装置
- Patent Title: Methods systems and apparatus for ranking tests used to identify faults in a system
- Patent Title (中): 方法用于对系统中的故障进行排序测试的系统和装置
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Application No.: US13161262Application Date: 2011-06-15
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Publication No.: US08831901B2Publication Date: 2014-09-09
- Inventor: Kelly Jean Lechtenberg , Qingqiu Ginger Shao
- Applicant: Kelly Jean Lechtenberg , Qingqiu Ginger Shao
- Applicant Address: US NJ Morristown
- Assignee: Honeywell International Inc.
- Current Assignee: Honeywell International Inc.
- Current Assignee Address: US NJ Morristown
- Agency: Ingrassa Fisher & Lorenz P.C.
- Main IPC: G01F19/00
- IPC: G01F19/00
Abstract:
Methods, systems and apparatus are provided for ranking tests of interest. A set of failure modes of interest and a set of tests of interest are determined. A differentiation factor is then computed for each of the tests of interest, and each of the tests of interest can then be ranked based on their respective differentiation factors.
Public/Granted literature
- US20120323518A1 METHODS SYSTEMS AND APPARATUS FOR RANKING TESTS USED TO IDENTIFY FAULTS IN A SYSTEM Public/Granted day:2012-12-20
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