Invention Grant
- Patent Title: Test apparatus, test method and system
- Patent Title (中): 测试仪器,测试方法和系统
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Application No.: US12943815Application Date: 2010-11-10
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Publication No.: US08831903B2Publication Date: 2014-09-09
- Inventor: Hironaga Yamashita
- Applicant: Hironaga Yamashita
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Main IPC: G01R31/319
- IPC: G01R31/319 ; G01R31/28 ; G06F11/30 ; G06F17/40 ; G06F19/00

Abstract:
A test apparatus for testing a device under test includes a control apparatus, a plurality of test modules, and a plurality of relay apparatuses that connect the control apparatus and the plurality of test modules, each relay apparatus including (1) an upper port section connected either to the control apparatus or to a relay apparatus nearer the control apparatus; and (2) at least one lower port section connected either to a relay apparatus nearer the plurality of test modules or to a corresponding test module, where each relay apparatus receives, at one of the at least one lower port section, a packet transmitted from the corresponding test module to the control apparatus, and transmits, from the upper port section, the received packet after adding thereto port identification information of the one of the at least one lower port section.
Public/Granted literature
- US20110282617A1 TEST APPARATUS, TEST METHOD AND SYSTEM Public/Granted day:2011-11-17
Information query
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