Invention Grant
- Patent Title: Failure sign detection apparatus
- Patent Title (中): 故障标志检测装置
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Application No.: US13095090Application Date: 2011-04-27
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Publication No.: US08831922B2Publication Date: 2014-09-09
- Inventor: Tadaaki Sakakibara , Hirokazu Watanabe , Yoshio Nakagaki , Kenji Fukuta
- Applicant: Tadaaki Sakakibara , Hirokazu Watanabe , Yoshio Nakagaki , Kenji Fukuta
- Applicant Address: JP Kariya
- Assignee: Denso Corporation
- Current Assignee: Denso Corporation
- Current Assignee Address: JP Kariya
- Agency: Nixon & Vanderhye PC
- Priority: JP2010-102185 20100427
- Main IPC: G05B23/02
- IPC: G05B23/02 ; G07C5/08 ; B60R16/023

Abstract:
The failure sign detection apparatus includes an abnormality detector to make a comparison between a failure detection parameter of a vehicle device mounted on a vehicle and a predetermined abnormality detection threshold, and make a determination whether there is an abnormality in the vehicle device based on a result of the comparison, a failure sign evaluation index calculator to calculate a failure sign evaluation index for evaluating a sign of failure of the vehicle device based on an abnormality duration period over which the detected abnormality continues and a parameter threshold difference indicative of a difference between the abnormality detection threshold and the failure detection parameter, and a failure sign detector to detect a sign of failure of the vehicle device based on the failure sign evaluation index calculated by the failure sign evaluation index.
Public/Granted literature
- US20110264323A1 FAILURE SIGN DETECTION APPARATUS Public/Granted day:2011-10-27
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