Invention Grant
- Patent Title: Methods for improving atomicity of runtime inspections
- Patent Title (中): 提高运行时检查原子性的方法
-
Application No.: US12818317Application Date: 2010-06-18
-
Publication No.: US08832684B2Publication Date: 2014-09-09
- Inventor: Mark A. Thober , J. Aaron Pendergrass , C. Durward McDonell, III , Michael D. DiRossi
- Applicant: Mark A. Thober , J. Aaron Pendergrass , C. Durward McDonell, III , Michael D. DiRossi
- Applicant Address: US MD Baltimore
- Assignee: The Johns Hopkins University
- Current Assignee: The Johns Hopkins University
- Current Assignee Address: US MD Baltimore
- Agent Noah J. Hayward
- Main IPC: G06F12/00
- IPC: G06F12/00 ; G06F3/00 ; G06F11/36 ; G06F9/455

Abstract:
A method for achieving atomicity while inspecting a running computer process using a copy-on-write process in a supervisor to generate a copy of a target's memory page being written to, prior to executing the write, the copy along with any unwritten to memory pages in the target being mapped to a measurement agent (MA) and used to reflect the state of the target at a particular moment in time which state when observed by the MA provides an atomic runtime inspection.
Public/Granted literature
- US20110010712A1 Methods for Improving Atomicity of Runtime Inspections Public/Granted day:2011-01-13
Information query