Invention Grant
- Patent Title: Storage devices with secure debugging capability and methods of operating the same
- Patent Title (中): 具有安全调试功能的存储设备及其操作方法
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Application No.: US12783953Application Date: 2010-05-20
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Publication No.: US08832843B2Publication Date: 2014-09-09
- Inventor: Chanho Yoon
- Applicant: Chanho Yoon
- Applicant Address: KR
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR
- Agency: Myers Bigel Sibley & Sajovec, P.A.
- Priority: KR10-2009-0044590 20090521
- Main IPC: G06F7/04
- IPC: G06F7/04 ; G06F17/30 ; H04N7/16 ; G06F11/30 ; G06F11/36 ; G06F21/78 ; H04L9/32 ; G06F11/00 ; G06F21/00 ; G06F13/36 ; G06F9/00 ; H04L29/06

Abstract:
A device includes a first bus, a second bus, a processor configured to communicate with a storage circuit through the first bus and to communicate with a debug host through the second bus and a control circuit configured to inhibit transfer of data from the second bus to the debug host while receiving authentication information from the debug host and to enable transfer of data from the second bus to the debug host responsive to authentication of the received authentication information. The control circuit may be configured to inhibit data transfer from the second bus to the debug host by causing dummy data to be transmitted to the debug host over a transmit channel between the device and the debug host.
Public/Granted literature
- US20100299467A1 STORAGE DEVICES WITH SECURE DEBUGGING CAPABILITY AND METHODS OF OPERATING THE SAME Public/Granted day:2010-11-25
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