Invention Grant
- Patent Title: Systems and methods for investigating a characteristic of a material using electron microscopy
- Patent Title (中): 用电子显微镜研究材料特性的系统和方法
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Application No.: US13746382Application Date: 2013-01-22
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Publication No.: US08835842B2Publication Date: 2014-09-16
- Inventor: Stuart I. Wright , Matthew M. Nowell , Lisa H Chan , Peter A. de Kloe , Tera Lyn Nylese
- Applicant: EDAX Inc.
- Applicant Address: US NJ Mahwah
- Assignee: EDAX
- Current Assignee: EDAX
- Current Assignee Address: US NJ Mahwah
- Agency: Hamilton DeSanctis & Cha
- Main IPC: H01J37/26
- IPC: H01J37/26 ; G01T1/36 ; H01J37/29 ; H01J37/285 ; G01N23/225
Abstract:
Various embodiments of the present invention provide systems and methods for determining an characteristic of a material. The characteristics may include, but are not limited to, crystallographic and chemical composition characteristics of a material.
Public/Granted literature
- US20130193321A1 Systems and Methods for Investigating a Characteristic of a Material Using Electron Microscopy Public/Granted day:2013-08-01
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