Invention Grant
- Patent Title: Integrated circuit configuration having extension conductor structure and fabricating method thereof
- Patent Title (中): 具有延伸导体结构的集成电路结构及其制造方法
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Application No.: US13338353Application Date: 2011-12-28
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Publication No.: US08835996B2Publication Date: 2014-09-16
- Inventor: Chin-Sheng Yang
- Applicant: Chin-Sheng Yang
- Applicant Address: TW Hsinchu
- Assignee: United Microelectronics Corporation
- Current Assignee: United Microelectronics Corporation
- Current Assignee Address: TW Hsinchu
- Agency: WPAT, PC
- Agent Justin King
- Main IPC: H01L29/78
- IPC: H01L29/78

Abstract:
An integrated circuit configuration includes a substrate, a diffusion region, a gate structure, an extension conductor structure, a dielectric layer, a contact structure, and a metal conductor line. The diffusion region is formed in the substrate. The gate structure is formed over the substrate and spanned across the diffusion region. The extension conductor structure is formed over the semiconductor substrate and contacted with the diffusion region. The extension conductor structure is extended externally to a first position along a surface of the substrate, wherein the first position is outside the diffusion region. The dielectric layer is formed over the substrate, the gate structure and the extension conductor structure. The contact structure is penetrated through the dielectric layer to be contacted with the first position of the extension conductor structure. The metal conductor line is formed on the dielectric layer and contacted with the contact structure.
Public/Granted literature
- US20130168742A1 INTEGRATED CIRCUIT CONFIGURATION AND FABRICATING METHOD THEREOF Public/Granted day:2013-07-04
Information query
IPC分类: