Invention Grant
- Patent Title: Vertically oriented inductor within interconnect structures and capacitor structure thereof
- Patent Title (中): 互连结构内的垂直取向电感器及其电容器结构
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Application No.: US13212982Application Date: 2011-08-18
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Publication No.: US08836078B2Publication Date: 2014-09-16
- Inventor: Hsiu-Ying Cho
- Applicant: Hsiu-Ying Cho
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Haynes and Boone, LLP
- Main IPC: H01L27/08
- IPC: H01L27/08 ; H01L23/522

Abstract:
The present disclosure involves a semiconductor device. The semiconductor device includes a substrate having a horizontal surface. The semiconductor device includes an interconnect structure formed over the horizontal surface of the substrate. The interconnect structure includes an inductor coil that is wound substantially in a vertical plane that is orthogonal to the horizontal surface of the substrate. The interconnect structure includes a capacitor disposed proximate to the inductor coil. The capacitor has an anode component and a cathode component. The inductor coil and the capacitor each include a plurality of horizontally extending elongate members.
Public/Granted literature
- US20130043557A1 VERTICALLY ORIENTED SEMICONDUCTOR DEVICE AND SHIELDING STRUCTURE THEREOF Public/Granted day:2013-02-21
Information query
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