Invention Grant
- Patent Title: Apparatus for chip thermal stress relief
- Patent Title (中): 芯片热应力释放装置
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Application No.: US13411541Application Date: 2012-03-03
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Publication No.: US08836104B2Publication Date: 2014-09-16
- Inventor: Ho-Yuan Yu
- Applicant: Ho-Yuan Yu
- Applicant Address: US CA Saratoga
- Assignee: Ho-Yuan Yu
- Current Assignee: Ho-Yuan Yu
- Current Assignee Address: US CA Saratoga
- Agency: Cheng Intellectual Property Group
- Main IPC: H01L23/34
- IPC: H01L23/34 ; H01L23/488

Abstract:
Various stress relief structures are provided for effectively reducing thermal stress on a semiconductor chip in a chip package. Trenches on a metal substrate are created in groups in two-dimension, where each trench is opened from top or bottom surface of the metal substrate and in various shapes. The metal substrate is partitioned into many smaller substrates depending on the number of trench groups and partitions, and is attached to a semiconductor chip for stress relief. In an alternative embodiment, a plurality of cylindrical metal structures are used together with a metal substrate in a chip package for the purpose of heat removal and thermal stress relief on a semiconductor chip. In another alternative embodiment, a metal foam is used together with a semiconductor chip to create a chip package. In another alternative embodiment, a semiconductor chip is sandwiched between a heat sink and a circuit board by solder bumps directly with underfill on the circuit board.
Public/Granted literature
- US20130228912A1 Apparatus for Chip Thermal Stress Relief Public/Granted day:2013-09-05
Information query
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