Invention Grant
- Patent Title: Micro-fabricated atomic magnetometer and method of forming the magnetometer
- Patent Title (中): 微型原子磁强计及形成磁力计的方法
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Application No.: US13314097Application Date: 2011-12-07
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Publication No.: US08836327B2Publication Date: 2014-09-16
- Inventor: William French , Philipp Lindorfer , Peter J. Hopper , Roozbeh Parsa , Andrew James West , Byron Jon Roderick Shulver
- Applicant: William French , Philipp Lindorfer , Peter J. Hopper , Roozbeh Parsa , Andrew James West , Byron Jon Roderick Shulver
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Agent Eugene C. Conser; Frederick J. Telecky, Jr.
- Main IPC: G01R33/02
- IPC: G01R33/02
Abstract:
The cost and size of an atomic magnetometer are reduced by attaching a vapor cell structure that has a vapor cell cavity to a base die that has a laser light source that outputs light to the vapor cell cavity, and attaching a photo detection die that has a photodiode to the vapor cell structure to detect light from the laser light source that passes through the vapor cell cavity.
Public/Granted literature
- US20130147472A1 Micro-Fabricated Atomic Magnetometer and Method of Forming the Magnetometer Public/Granted day:2013-06-13
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