Invention Grant
- Patent Title: Digitally displaying inspection system for ESD protection chip
- Patent Title (中): 数字显示ESD保护芯片检测系统
-
Application No.: US13807066Application Date: 2012-12-01
-
Publication No.: US08836353B2Publication Date: 2014-09-16
- Inventor: Xiaoyu Huang , Mingfeng Deng , Jungmao Tsai
- Applicant: Shenzhen China Star Optoelectronics Technology Co., Ltd.
- Applicant Address: CN Shenzhen, Guangdong
- Assignee: Shenzhen China Star Optoelectronics Technology Co., Ltd
- Current Assignee: Shenzhen China Star Optoelectronics Technology Co., Ltd
- Current Assignee Address: CN Shenzhen, Guangdong
- Agent Andrew C. Cheng
- International Application: PCT/CN2012/085706 WO 20121201
- International Announcement: WO2014/079099 WO 20140530
- Main IPC: G01R31/10
- IPC: G01R31/10

Abstract:
The present invention provides a digitally displaying inspection system for ESD protection chip, which includes an LVDS connector, a display system, first, second, and the third data lines, a power supply, and a resistor. The first, second, and third data lines each have an end electrically connected to the LVDS connector and an opposite end electrically connected to the display system. The display system includes a logic operation module and a digital display module electrically connected to the logic operation module. The logic operation module is electrically connected to the first, second, and third data lines. When an ESD protection chip is electrically connected to the LVDS connector, the logic operation module samples signals on the first, second, and third data lines and drive, after carrying out logic operations, the digital display module to display character signs, which can identify if the ESD protection chip is incorrectly connected.
Public/Granted literature
- US20140145738A1 DIGITALLY DISPLAYING INSPECTION SYSTEM FOR ESD PROTECTION CHIP Public/Granted day:2014-05-29
Information query