Invention Grant
US08841601B2 Non-linear calibration of a microbolometer included in an infrared imaging system
有权
包括在红外成像系统中的微电热计的非线性校准
- Patent Title: Non-linear calibration of a microbolometer included in an infrared imaging system
- Patent Title (中): 包括在红外成像系统中的微电热计的非线性校准
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Application No.: US13359613Application Date: 2012-01-27
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Publication No.: US08841601B2Publication Date: 2014-09-23
- Inventor: Jeffrey H Lee
- Applicant: Jeffrey H Lee
- Applicant Address: US NH Nashua
- Assignee: BAE Systems Information and Electronic Systems Integration Inc.
- Current Assignee: BAE Systems Information and Electronic Systems Integration Inc.
- Current Assignee Address: US NH Nashua
- Agency: Maine Cernota & Rardin
- Agent Douglas P. Burum
- Main IPC: G01D18/00
- IPC: G01D18/00 ; G12B13/00 ; G01J5/22 ; H04N5/33 ; G01J5/06 ; G01J5/00

Abstract:
An apparatus and method for reducing nonlinearity artifacts in an IR imaging system applies a non-linear correcting function to signals received from a microbolometer. The non-linear correcting function can be a second-order polynomial, a third-order polynomial, some other formula, or a table from which corrections can be interpolated. In embodiments, the correcting function is automatically adjusted according to an ambient temperature measurement, to which a non-linear correction can be applied, either in a separate step or as an adjustment to the correcting function applied to the microbolometer signals.
Public/Granted literature
- US20130193326A1 NON-LINEAR CALIBRATION OF NIGHT VISION MICROBOLOMETER Public/Granted day:2013-08-01
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