Invention Grant
US08841616B2 Terahertz wave detecting device, imaging device, and measuring device
有权
太赫兹波检测装置,成像装置和测量装置
- Patent Title: Terahertz wave detecting device, imaging device, and measuring device
- Patent Title (中): 太赫兹波检测装置,成像装置和测量装置
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Application No.: US13656809Application Date: 2012-10-22
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Publication No.: US08841616B2Publication Date: 2014-09-23
- Inventor: Hiroto Tomioka
- Applicant: Seiko Epson Corporation
- Applicant Address: JP Tokyo
- Assignee: Seiko Epson Corporation
- Current Assignee: Seiko Epson Corporation
- Current Assignee Address: JP Tokyo
- Agency: Global IP Counselors, LLP
- Priority: JP2011-232556 20111024
- Main IPC: H01L25/00
- IPC: H01L25/00 ; G01J5/08 ; G01J3/42 ; G01J3/12

Abstract:
A terahertz wave detecting device includes a wavelength filter and a detection part. The wavelength filter is configured to convert terahertz waves to heat. The detection part is configured to detect the heat converted by the wavelength filter. The wavelength filter includes a wavelength selection layer and a terahertz wave absorption layer. The wavelength selection layer is configured to transmit terahertz waves of a prescribed wavelength among the terahertz waves. The terahertz wave absorption layer is provided in contact with the wavelength selection layer and the detection part, and contains a material for absorbing the terahertz waves of the prescribed wavelength.
Public/Granted literature
- US20130099118A1 TERAHERTZ WAVE DETECTING DEVICE, IMAGING DEVICE, AND MEASURING DEVICE Public/Granted day:2013-04-25
Information query
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