Invention Grant
- Patent Title: Method and inspection device for bright spot defect detection of a polarizer
- Patent Title (中): 偏振片的光斑缺陷检测方法及检查装置
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Application No.: US13214134Application Date: 2011-08-19
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Publication No.: US08842270B2Publication Date: 2014-09-23
- Inventor: Shin-Min Chao
- Applicant: Shin-Min Chao
- Applicant Address: TW Taoyuan
- Assignee: BENQ Materials Corp.
- Current Assignee: BENQ Materials Corp.
- Current Assignee Address: TW Taoyuan
- Agency: Ladas & Parry, LLP
- Priority: TW100105777A 20110222
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01N21/958

Abstract:
A method of bright spot defect detection for a polarizer is to be performed by an inspection device and includes the steps of: a) obtaining gray values for pixels of an image of a detected region, that contains a target spot, on the polarizer; b) obtaining a gray value variation score from the gray values obtained for the detected region, the gray value variation score being indicative of gray value variation among the pixels of the image of the detected region; and c) comparing the gray value variation score obtained for the detected region with a threshold value to obtain a comparison result, and determining whether the target spot is a bright spot according to the comparison result.
Public/Granted literature
- US20120212741A1 METHOD AND INSPECTION DEVICE FOR BRIGHT SPOT DEFECT DETECTION OF A POLARIZER Public/Granted day:2012-08-23
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