Invention Grant
US08848244B2 Image inspection method, apparatus, control program overlapping inspection images to obtain positional shift
有权
图像检查方法，装置，控制程序重叠检查图像以获得位置偏移
- Patent Title: Image inspection method, apparatus, control program overlapping inspection images to obtain positional shift
- Patent Title (中): 图像检查方法，装置，控制程序重叠检查图像以获得位置偏移
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Application No.: US13790316Application Date: 2013-03-08
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Publication No.: US08848244B2Publication Date: 2014-09-30
- Inventor: Hitomi Kaneko , Tadashi Kitai , Hiroyoshi Ishizaki , Keiji Kojima , Hiroyuki Kawamoto , Keiichi Miyamoto
- Applicant: Hitomi Kaneko , Tadashi Kitai , Hiroyoshi Ishizaki , Keiji Kojima , Hiroyuki Kawamoto , Keiichi Miyamoto
- Applicant Address: JP Tokyo
- Assignee: Ricoh Company, Ltd.
- Current Assignee: Ricoh Company, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Cooper & Dunham LLP
- Priority: JP2012-065466 20120322
- Main IPC: G06K15/12
- IPC: G06K15/12 ; H04N1/387 ; G06K9/03 ; G06T7/00
Abstract:
An image inspection apparatus obtains a threshold value indicating an allowable range of offset differences between an output target inspection image and a pre-provided inspection image, and determines whether to inspect a read image obtained by reading an output target image formed on a recording sheet having a pre-provided image, using the threshold value.
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